| 1 |
SN74BCT8374ADW |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
485K |
|
|
| 2 |
SN74BCT8374ADW |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
| 3 |
SN74BCT8374ADWE4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
485K |
|
|
| 4 |
SN74BCT8374ADWE4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
| 5 |
SN74BCT8374ADWG4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
| 6 |
SN74BCT8374ADWR |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
485K |
|
|
| 7 |
SN74BCT8374ADWR |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
| 8 |
SN74BCT8374ADWRE4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
485K |
|
|
| 9 |
SN74BCT8374ADWRE4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
| 10 |
SN74BCT8374ADWRG4 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |
659K |
|
|
